高精度实验室系列：模数转换器 (ADC)

SPI communication basics (modes)

SPI communications timing

I2C introduction: The protocol

Introduction to I2C: Example

Introduction to I2C: Reserved addresses

Introduction to I2C: Advanced topics

ADC DC specifications: INL, DNL, Cin, leakage, Vref

AC & DC specifications: Offset error, gain error, CMRR, PSRR, SNR and THD

SAR and delta-sigma: Basic operation

Digital filters and latency

SAR and delta-sigma: Noise and drive considerations

Choosing SAR or delta-sigma

SAR ADC input types

Determining a SAR ADC’s linear range when using operational amplifiers

Hands-on experiment: Crossover distortion on ADC drive

Determining a SAR ADC’s linear range when using instrumentation amplifiers

Driving a SAR ADC with a fully differential amplifier

Statistics behind error analysis of ADC system

Understanding and calibrating the offset and gain for ADC systems

Using SPICE Monte Carlo tool for statistical error analysis

Introduction to noise in ADC systems

Types of noise in ADCs

ADC noise measurement, methods and parameters

System noise performance for low-speed delta-sigma ADCs

Analyzing and calculating noise bandwidth in ADC systems – multi-stage filters

Analyzing and calculating noise bandwidth in ADC systems – the digital filter

Gain impact on noise, ADC FSR and dynamic range

Calculating amplifier + ADC total noise: design examples

Introduction to reference noise in ADC systems

Reference noise affect on signal chain performance

Reducing reference noise ADC systems: ratiometric, internal, external

Calculating the total noise for ADC systems

Hands-on experiment: ADC noise

Introduction to frequency domain

Fast Fourier transforms (FFTs) and windowing

Coherent sampling and filtering to improve SNR and THD

Aliasing and anti-aliasing filters

Hands-on experiment: Aliasing and anti-aliasing filters

Introduction to SAR ADC front-end component selection

Selecting and verifying the driver amplifier

Building the SAR ADC model

Refine the Rfilt and Cfilt values on ADC drive

Hands-on experiment: Amplifier settling and charge bucket filter design

Math behind the R-C component selection

Driving SAR ADC without amplifiers

Voltage reference overview for ADC

Overview of reference drive topologies

SAR reference input: The CDAC

Understanding the SAR reference input model

Developing the SAR reference input model

Hands-on experiment: Reference drive

SAR ADC power scaling

Hands-on experiment: System power scaling

EOS and ESD on ADC

External EOS protection devices

Import diode's PSpice model into TINA

Protecting low voltage ADC from high voltage amp

Protecting low voltage ADC: Improved solution

Protecting ADC with TVS diode

Protecting ADC with TVS diode: Improved solution

Protecting Delta-Sigma ADC: RTD Overview

Protecting Delta-Sigma ADC: Input Protection Circuit Operation

Protecting Delta-Sigma Component Selection

Protecting Delta-Sigma with TVS: Performance Impact

Protecting Delta-Sigma ADC: Special Input Range

Introduction - PCB design for good EMC

PCB trace as a wave guide

PCB stackup impact on performance

PCB trace impedance matching

Crosstalk on PCB layouts

Data integrity issues

Decoupling capacitors

Electromagnetic compatibility testing methods and standards

Comparing high-speed analog-to-digital (ADC) and digital-to-analog (DAC) converter architectures

Jitter's impact on signal-to-noise ratio (SNR) for high-speed analog-to-digital converters (ADCs)

Understanding signal to noise ratio and noise spectral density in high speed data converters

Bandwidth vs. frequency: Subsampling concepts

Sampling vs. data rate, decimation (DDC) and interpolation (DUC) in high-speed data converters

Understanding sampling, Nyquist zones, harmonics and spurious performance in high-speed ADCs

High-speed data converter signal processing: Real and complex modulation

Introduction To RTDs

RTD Measurement Circuits

Challenges with 3-wire RTD systems

Measuring multiple RTDs with a multiplexed ADC & intro to conversion latency

Designing software versus hardware configurable multi-RTD measurement systems